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ADE
Applied Materials
August Technology
Inspex
KLA-Tencor
TSK

Featured Products

Our new product is to
parse, view, modify,
and store files coming
from various defect
inspection stations.

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News / Events

Zenpire is is adding 3D wafer mapping. In Septembet 2012, Zenpire will officially have wafermaps which users can zoom in and zoom out just like first person gaming. This enhances the viewing environment as users drill down for defects and patterns of interest and all of the information included with those, review images, test data, SEM and other Failures Analysis data. This is all part of the newly introduced "OneFactor-e ®" 2.0 product line.

Zenpire becomes the first yield analysis provider to integrate into NoSQL databases including those used by Yahoo and Facebook. More to come in the fall of 2012..