Defect Factor

Setup Factor

Utilities Factor

Test Factor

FA Factor

Central Factor

Bit Factor

Pixel Factor

OneFactor-e Modules: FA Factor

FA Factor is closely related to the Test Factor module. Similar to Test Factor, FA Factor can control testers, wafer handlers, and microscopes via the serial, ethernet, and soon GPIB connections. However, previously created yield, defect, and bit maps can be imported and shown on the user interface. Once shown, users can click on die, defects, and bits driving the stage to that location. At that location, microscope magnifications can be changed and test routines can be invoked. FA Factor can be used to identify bit locations when used in conjunction with the Bit Factor module plug-ins. FA Factor is in Beta testing.